Research
Web Research
Links
About
Home
|
Research Interests
The focus of my current research involves a
UHV Omicron Scanning Probe Microscope
(SPM) which is being integrated into a system with two Molecular Beam Epitaxy (MBE)
chambers and an analysis chamber with dual X-ray Photoelectron Spectroscopy (XPS)
and an Auger Electron Spectroscopy (AES) capabilities.
This powerful tool will allow in situ analysis and modification of materials
grown with the MBE systems. Since the materials will remain in Ultra High Vacuum
(UHV), contamination layers which would form on materials with exposure to air
are virtually eliminated.
Although the in-situ SPM provides unparalleled performace for maintaining the surface
of samples, it is not always required to procure information about a material. Therefore,
a Topometrix air SPM is often used for material evaluation.
We have recently incorporated the scanning system in an environmental control box to
provide a dried/heated N2 gas environment which will remove water from the surface
and enhance the surface detail.
Current work with the Topometrix system involves an
Optical study of III-V Multiple quantum wells
which can be reviewed at this site.
Prior to my arrival in Oklahoma I was involved with research at
Vanderbilt University
with Len Feldman using a 2 MeV Van de Graff
accelerator for materials analysis of the SiO2/SiC interface, the SMART-CUT process
in SiC and hydrogen defects in silicon. My experience in
ion beams initiated during my graduate work at
Ohio University
with David Ingram. My focus there was hydrogen analysis of diamond-like carbon using Elasitic
Recoil Spectroscopy (ERS). I'm still pursuing an upgrade to a RBS/ERS command-line program (IRMA)
written during my graduate work to incorporate a GUI interface.
|
Put image here
|
Main:
Research |
Web Info |
About |
Home
|
Leave this space blank
|
|
